ELECTRICA

STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

1.

Istanbul University Engineering Faculty, Electrical and Electronics Department 34320 Avcilar,Istanbul-Turkey

2.

University of İstanbul, Electrical-Electronics Engineering Department Avcilar, 34320, Istanbul

3.

Department of Electronics and Communication Engineering, İstanbul Technical University, İstanbul, Turkey

ELECTRICA 2008; 8: 549-555
Read: 126 Downloads: 79 Published: 02 January 2012

In this paper, symmetrical CMOS OTA degradation is investigated with using statistical methods. OTA’ s are degraded using 4155 parameter analyzer and output current change is observed. An appopriate fitting curve is realised with MATLAB programme by taking into consedaration the error. Lifetime of the OTA’s are determined with the %10 lifetime criteria. And probability density function is observed and lifetime is calculated statistically. Also, failure rate, reliability function and the cumulative distribution functions are observed.

Files
EISSN 2619-9831