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Vol. 8 No. 1 (2008): ELECTRICA

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Published: Jan 2, 2012
Keywords:
Symmetrical CMOS OTA, Reliability Analysis, Statistical Methods

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Yasin ÖZCELEP
Istanbul University Engineering Faculty, Electrical and Electronics Department 34320 Avcilar,Istanbul-Turkey
Ayten KUNTMAN
University of İstanbul, Electrical-Electronics Engineering Department Avcilar, 34320, Istanbul
H. Hakan Kuntman
Department of Electronics and Communication Engineering, İstanbul Technical University, İstanbul, Turkey

STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

Main Article Content

Yasin ÖZCELEP
Istanbul University Engineering Faculty, Electrical and Electronics Department 34320 Avcilar,Istanbul-Turkey
Ayten KUNTMAN
University of İstanbul, Electrical-Electronics Engineering Department Avcilar, 34320, Istanbul
H. Hakan Kuntman
Department of Electronics and Communication Engineering, İstanbul Technical University, İstanbul, Turkey

Abstract

In this paper, symmetrical CMOS OTA degradation is investigated with using statistical methods. OTA’ s are degraded using 4155 parameter analyzer and output current change is observed. An appopriate fitting curve is realised with MATLAB programme by taking into consedaration the error. Lifetime of the OTA’s are determined with the %10 lifetime criteria. And probability density function is observed and lifetime is calculated statistically. Also, failure rate, reliability function and the cumulative distribution functions are observed.


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