Articles

Vol. 17 No. 1 (2017): ELECTRICA

A NOVEL REVERSIBLE FAULT TOLERANT MICROPROCESSOR DESIGN IN AMS 0.35UM PROCESS

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M. Hüsrev CILASUN
Mustafa ALTUN

Abstract

In this study, reversible circuits are revisited to achieve extreme soft-defect awareness in classical CMOS circuits. Defect models in the literature are reviewed and defect scattering is analyzed. A reversible 8-bit full adder is designed in 12-bit block code domain. As a proof of concept, a pair of reversible ALUs are embedded into a microprocessor with block-code encoded data-path. The design is simulated in ams 0.35um process and a layout is obtained for tapeout.


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